Web7 Feb 2005 · In this work, a Phillips (FEI) XL-40 FEGSEM coupled to a TexSEM Laboratories OIM system was used. The pattern capturing hardware consisted of both a 512 by 512 pixel SIT CCD camera and a 1300 by 1030 pixel Peltier cooled CCD camera. Automated scans of various sizes, each consisting of 2500 points, were performed on a commercial-grade … WebTSL OIM analysis 4.6 software developed by TEXSEM laboratories Inc. was used to analyze the EBSD maps. For tensile testing, samples were prepared according to the ASTM subsize specimen with 25 mm...

Extracting twins from orientation imaging microscopy scan data

WebEBSD pattern reindexing to improve indexing performance away from the scanning electron microscope (SEM) with EDAX’s Triplet Indexing, ChI-Scan™, and NPAR™ technologies … Web1519 hydrostatic pressure in a Bridgman anvil used for studying plastic deformation [4]. In this case, the defect density of the crystalline structure sharply rises involving the dislocation substructure which significantly distorts the microstructure dauphin county dispatch phone number

Mechanical characterisation of hydrogen-induced quasi-cleavage …

WebTexSEM Laboratories, Inc., 226W 2230N, Provo, Utah 84604 John E. Sanchez, Jr. Department of Materials Science and Engineering, University of Michigan, Ann Arbor, Michigan 48109-2136 Paul R. Besser Advanced Micro Devices, Sunnyvale, California 94088-3453 David J. Dingley TexSEM Laboratories, Inc., 226W 2230N, Provo, Utah 84604 WebS.I Wright - TexSEM Laboratories/EDAX, Draper, UT 84020, USA M Kumar - Lawrence Livermore National Laboratory, Livermore, CA 94550, USA Show Creators Publication … WebThe world’s first and only commercially available electron backscatter diffraction (EBSD) detector with unparalleled performance as low as 3 kV. This direct detection system is … black agate jewellery